桌上型掃描式電子顯微鏡 JCM-6000 NeoScope
Automatic image formation after sample introduction within 3 minutes
High resolution (60,000X) and large depth of field
Multi-touch screen interface for intuitive operation
Advance automatic functions (focus, stigmation, brightness/contrast)
High and low vacuum modes
Three selectable accelerating voltages
Secondary electron and solid state backscattered electron detector
Large sample coverage (up to 70 mm diameter)
Options include: motor drive stage and EDS
http://www.jeol.co.jp/en/products/detail/product_file/file/p_jcm-6000_en_catalogue.pdf
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